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International Etalon Forum 3. – 4. November 2016

Controlling the micron in industry and research

To celebrate our 12th anniversary, we are organizing a professional event focussing on “Controlling the micron in industry and research” in cooperation with our customers and partners. The event targets technical experts and decision makers from

  • machine tool and metrology business
  • production in the aerospace, automotive and energy sector
  • the research sector with challenging geometrical metrology tasks

With the forum, we would like to repeat our success of the 2013’s event with over 120 participants – however, introducing one major change: The Etalon Forum 2016 will be held in English language, thus welcoming partners and customers on an international base.

Download program and registration form!

 

We have compiled the following program for you:

 

Thursday Nov 3rd 13:00–17:30

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12:00 -13:00 Registration

13:00       Dr. H. Schwenke,  Etalon AG:
Welcome

13:15       Dr. D. Imkamp, Zeiss IMT GmbH:
Metrology on the shop floor, where else? – Potentials and Limitations

13:45       E. Schaarschmidt, Siemens AG:
Metrology on machine tools – technical requirements and solutions

14:00       K. Kunis, Siemens AG:
Improvement of machine precision by using kinematic measurement and compensation strategies (VCS)

14:15       U. Warnatz, Fanuc Europe:
Control Technical Solutions for Typical Problems of Machine Tools

14:45       G. Günther, Heidenhain:
Methodically enhance the part accuracy with TNC controller features

15:15       Coffee break

16:00       M. Wennemer, WZL-Aachen:
A case study on a very large machine tool: Systematic deviations & thermo-elastic deformations

16:30       R.Ottone, ISONORM:
ISO 16907: Benefits and limitations of compensation of machine tool’s geometric errors

17:00       C. Hitchens, Nuclear Advanced Manufacturing Centre (NARMC):
Inspection of Large High Value Components In-Process on a Machine Tool Platform

17:30      Dr. H. Schwenke, Etalon AG:
Measurement, Compensation, Monitoring – Good practice and pitfalls

18:00      End

18:30       Get-Together and Dinner

 


Friday Nov 4th 8:30–12:00

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08:30       M. Peterek, WZL-Aachen:
Advances in Large-Scale Metrology – Technologies and Models for Cyber-Physical Systems

09:00       Dr. K. Kniel, PTB:
Tracebility for large scale metrology

09:30       Prof. A. Reichold,  Oxford University
From academic research to industrial products and back: FSI technology past, present and future

10:00       Dr. H. Schwenke, Etalon AG
An applications driven toolbox for the Absolute Multiline Technology

10:30       Coffee break

11:00       J.-C. Gayde, CERN
Big physics and small tolerances: Metrology challenges and solutions at CERN

11:30       S. Lévêque, ESO
Metrology for the European Extremely Large Telescope

12:00      Wrap-up and Good bye

 

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We will kindly ask all participants for a participation fee of 95 € per person.

Download program and registration form!

 

We look forward to meeting you in Braunschweig!

 

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